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High
Angular Resolution Microbeam Diffraction Analysis of Optoelectronic SAG
Structures |
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![]() Sample: multiple quantum well (MQW) waveguide grown in narrow regions between oxide masks. |
![]() High resolution reciprocal space map |
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Goal: high angular resolution analysis of strain (composition) and thickness of active layers of optoelectronic structures grown by MOCVD in the regime of selective area growth (SAG); Optics:
one-bounce capillary producing round beam of 10 |
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Publications: A. Kazimirov, D. H. Bilderback, R. Huang, and A. Sirenko, “Microbeam X-Ray Standing Wave and High Resolution Diffraction”, Synchrotron Radiation Instrumentation: Eighth International Conference on Synchrotron Radiation Instrumentation, AIP Proceedings 705, Eds. Stohr, Padmore, Warwick, Arthur 1027 (2004) A. Kazimirov, D. H. Bilderback, R. Huang, A. Sirenko, and A. Ougazzaden, “Microbeam High-resolution Diffraction and X-ray Standing Wave Methods Applied to Semiconductor Structures”, Journal of Physics D: Applied Physics, Rapid Communications, 37; L9-L12 (2004) A. A. Sirenko, A. Kazimirov, R. Huang, D. H. Bilderback, S. O’Malley, V. Gupta, K. Bacher, L. J. P. Ketelsen, and A. Ougazzaden, “Micro-beam High-resolution X-ray Diffraction in Strained InGaAlAs-based Multiple Quantum Well Laser Structures Grown Selectively on Masked InP Substrates”, Journal of Applied Physics, 97; 063512(1-7) (2005) A. A. Sirenko, A. Kazimirov, A. Ougazzaden, S. O’Malley, D. H. Bilderback, Z.-H. Cai, B. Lai, R. Huang, V. Gupta, M. Chien, and S. N. G. Chu, “Strain Relaxation and Surface Migration Effects in InGaAlAs and InGaAsP Selective Area Grown Ridge Waveguides”, Applied Phys. Letters, 88; 081111 (2006) A Kazimirov, A A Sirenko, DH Bilderback, Z-H Cai, B Lai, R Huang, A Ougazzaden, “Synchrotron High Angular Resolution Microdiffraction Analysis of Selective Area Grown Optoelectronic Waveguide Arrays”, Journal of Physics D: Applied Physics, 39; 1422-1426 (2006) |
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2008 Run
Nov 19th - Dec 22nd




