Skip to main content
more options

High-resolution diffraction analysis of nanoscale self-organization in thin films
PIs: Andrei Sirenko (NJIT), S.M. O’Malley (Rutgers)

Goal: analysis of self-assembled nano-structures thin films

Technique: reciprocal space mapping
Beamline optics: Si(111), white beam mirror

Sample: ZnGaMnO4 (ZMGO) spinel oxide thin film grown by PLD. Nano-rod domain size: 4 x 4 x 750 nm3.

 


Identification of in-plane checkerboard phases using reciprocal map in the vicinity of asymmetrical 044 reflection:

Publications:

S. Park, Y. Horibe, T. Asada, L.S. Wielunski, N. Lee, P.L. Bonanno, S.M. O'Malley, A.A. Sirenko, A. Kazimirov, M. Tanimura, T. Gustafsson, and S.-W. Cheong; "Highly Aligned Epitaxial Nanorods with a Checkerboard Pattern in Oxide Films", NanoLetters, v.8, 2, 720-724 (2008)

S. M. O'Malley, P.L. Bonanno, K.H. Ahn, A.A. Sirenko, A. Kazimirov, S. Park, and S.-W. Cheong; "Epitaxial Checkerboard Arrangement of nanorods in ZnMnGaO4 Films Studied by X-ray Diffraction", Phys. Rev. B, v.78, 165424-1 - 165424-5 (2008)

2012 X-ray Runs

Feb. 22nd - March 26th
May 30th - July 2nd

Related Resources