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CHESS West
A2 Station
A2 beamline receives half
of the X-ray beam from the 5.3 GeV e- beam passing through the
49 pole wiggler. High flux, wide energy range of up to 60 KeV, and
flexible crystal and multilayer optics make possible variety of
experiments in diverse areas of material science and solid state physics.
A2 Users Science includes
(but not limited to):
A2 Schematic
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A2 station summary |
|
Source: |
Number of Poles |
49 |
|
Period (cm) |
12 |
|
Peak Magnetic Field (T) |
0.8 |
|
Critical Energy, (keV)@5.3GeV |
14.9 |
|
Deflection Parameter, K |
9 |
|
Length, m |
3 |
| |
|
Source size: |
FWHM (horizontal) = 3.61 mm, FWHM (vertical) = 1.07 mm |
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Distance to
source: |
35.5 m to center of A2 hutch |
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Beam Position Monitors (BPM): |
| |
Photoelectron Monitor (PE) |
21 m from the source |
| |
Diode BPM |
26.4 m |
| |
Video Beam Position Monitor (VBPM) |
26.5 m |
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Filters and Windows: |
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Graphite Filter |
0.762 mm |
| |
Total Thickness of Be Windows |
3.1 mm |
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Mirror: |
| |
Rh coated, electroless-nickel-plated Glidcop |
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600 mm x 80 mm x 80 mm |
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bendable (vertical focusing) |
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Monochromator: |
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Double-bounce upward, offset: 20 to 40 mm |
| |
Operates in vacuum (10-8 torr) |
| |
Can accommodate both crystals and multilayers |
| |
Graphite filter with thickness 0-24 mm in front of 1st
crystal |
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Standard Monochromator Optics: |
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Crystals: |
|
1st crystal |
2nd crystal |
Energy Range, keV |
|
flat 75mm x 50mm Si(111) |
flat 75mm x 50mm Si(111) |
7-50 |
|
flat 75mm x 50mm Si(111) |
sagittal Si(111) |
7-22 |
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Multilayers: |
|
d-spacing, Å |
Material |
Substrate |
Refl |
 E/E,% |
|
15 |
Mo/B4C |
200x50x10mm, flat; SiC |
0.4 |
0.3 |
|
Mo/B4C |
200x50x10mm, flat; Si |
0.4 |
0.3 |
|
W/B4C |
200x50x25mm, curved; Si |
0.5 |
0.5 |
|
20 |
Mo/B4C |
200x50x10mm, flat; SiC |
0.65 |
0.6 |
|
Mo/B4C |
200x50x10mm, flat; Si |
0.65 |
0.6 |
|
W/B4C |
200x50x25mm, curved; Si |
0.65 |
0.8 |
|
28 |
W/B4C |
200x50x25mm, SiC |
0.8 |
1.9 |
|
W/B4C |
200x50x25mm, Si |
0.8 |
1.9 |
|
W/B4C |
200x50x25mm, curved; Si |
0.8 |
1.9 |
| |
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Optical table - used to assemble slits, ion chambers,
He-flight tubes, additional optics (channel-cut crystals, capillary,
shutters, translation stages, auxiliary equipment).
Huber
four-circle diffractometer - used for general X-ray diffraction
and scattering, microbeam diffraction, X-ray Standing Wave and other
techniques; equipped with high count rate Bede scintillation
detector; linear and 2D detectors (available upon request) can be
also mounted on 2-th detector arm.
Additional optics - double-bounce and three-bounce Si and
Ge channel-cut crystals; miniature double-bounce Si and Ge
channel-cuts for high angular resolution microbeam experiments.
Detectors -
MAR345,
CCD,
XFlash
and other Si and Ge
energy-dispersive detectors are available on request. |
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Last Update:
2006-09-21
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