Capabilities of InSitµ

The team at InSitµ provides enhanced support for a new generation of industrial users, strengthening your experience during the experiment and simulation.

We are material modelers. We work with mechanical civil, and structural engineers to create mathematical modeling, build a computational prototype, and then validate that modeling design to measure, understand and account for stress.

  1. Polychromatic “white” beam diffraction: The white beam capability of the new CHESS-U sector 1 will enable detailed maps of stress gradients at an engineering sized scale, up to several centimeters of depth within an engineering component.
  2. Monochromatic experiments: Using the rotating crystal method, diffraction experiments are conducted on polycrystalline metallic samples. In-situ loading and heating stages enable collection of data “during” elastic-plastic deformation. Both polycrystalline grain maps and the mechanical response at the crystal and aggregate scale can be determined using the software infrastructure resident at the beamline.
  3. Real time processes: X-ray pixel array detectors suitable for use with InSitμ’s very hard x-rays are being developed by the detector group. These include the Keck-PAD, a burst-rate imager suitable for processes on the microsecond time scale and the MM-PAD, a wide dynamic imager for millisecond time scale processes and total scattering. Both CdTe and GaAs x-ray converters will be utilized, enabling real-time understanding of processes such as high speed impact, stress relaxation, solidification and phase transformations. For more information, see [link].
  4. Model support: Much of the utility and potential of the high energy x-ray diffraction data is using them in conjunction with sophisticated multi-scale material models. The enhanced support given by our engineers at InSitµ extends to these models as well.