FAST Beamline

Description:

Time-resolved studies of manufacturing processes and performance of structural materials.

Lead Scientist:

Kate Shanks

Capabilities available and under development:

Techniques:

Near field high-energy diffraction microscopy

Far-field high-energy diffraction microscopy

μ-computed tomography

Area detector-based powder diffraction

High-speed diffraction (kHz-MHz)*

Sample environments:

Laser Powder Fusion Additive Manufacturing Testbed*

Tensile Loading (RAMS2)

High-Cycle Fatigue Loading (Bose)

Tensile-Torsion Loading (RAMS4)*

(* indicates capabilities under development)

Anticipated availability of beamline capabilities:

April 2020:
Photon energy range: 20-40keV for Si(111); 40-70keV for Si(311);

Techniques: Near field high-energy diffraction microscopy; Far-field high-energy diffraction microscopy; μ-computed tomography; Area detector-based powder diffraction.

Sample environments: Tensile Loading (RAMS2); High-Cycle Fatigue Loading (Bose); Compact Load Frame (CLF)

Photon Energy Range:

20-40keV for Si(111); 40-70keV for Si(311)

Energy Resolution:

Si(111): 0.002; Si(311): 0.0006

Spot size:

Beam size: 2 mm (h) 1 mm (v) (Si 111), 2 mm (h) 0.25mm (v) (Si 311)